Information card for entry 1546986
| Formula |
C47 H42 O0.5 |
| Calculated formula |
C47 H42 O0.5 |
| SMILES |
c12c3c(cc(c4cc5c(cc4)c4c(C5(C)C)cccc4)cc3)C(c2cc(cc1)c1ccc2c(C(c3c2cccc3)(C)C)c1)(C)C.C1CCCO1 |
| Title of publication |
Conformational Effect of Polymorphic Terfluorene on Photophysics, Crystal Morphologies, and Lasing Behaviors |
| Authors of publication |
Ou, Chang-Jin; Ding, Xue-Hua; Li, Yin-Xiang; Zhu, Can; Yu, Meng-Na; Xie, Ling-Hai; Lin, Jin-Yi; Xu, Chun-Xiang; Huang, Wei |
| Journal of publication |
The Journal of Physical Chemistry C |
| Year of publication |
2017 |
| Journal volume |
121 |
| Journal issue |
27 |
| Pages of publication |
14803 |
| a |
19.4248 ± 0.0014 Å |
| b |
22.9964 ± 0.0016 Å |
| c |
16.8921 ± 0.0013 Å |
| α |
90° |
| β |
112.874 ± 0.002° |
| γ |
90° |
| Cell volume |
6952.3 ± 0.9 Å3 |
| Cell temperature |
285 K |
| Ambient diffraction temperature |
284.98 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1815 |
| Residual factor for significantly intense reflections |
0.0696 |
| Weighted residual factors for significantly intense reflections |
0.1446 |
| Weighted residual factors for all reflections included in the refinement |
0.1865 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.024 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/1546986.html