Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1547088
Preview
Coordinates | 1547088.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C70 H74 N2 O4 Si2 |
---|---|
Calculated formula | C70 H74 N2 O4 Si2 |
SMILES | [Si]1(c2cc3C(=O)N(C(=O)c4cc5[Si](c6cc7C(=O)N(C(=O)c8cc1c1c2c(c5c6c1c78)c34)c1c(C(C)C)cccc1C(C)C)(CC)CC)c1c(cccc1C(C)C)C(C)C)(CC)CC.c1(ccccc1)C.c1ccc(cc1)C |
Title of publication | Palladium-Catalyzed Si-C Bond Formation toward Sila-Annulated Perylene Diimides. |
Authors of publication | Ma, Zetong; Xiao, Chengyi; Liu, Chunming; Meng, Dong; Jiang, Wei; Wang, Zhaohui |
Journal of publication | Organic letters |
Year of publication | 2017 |
Journal volume | 19 |
Journal issue | 16 |
Pages of publication | 4331 - 4334 |
a | 12.123 ± 0.002 Å |
b | 15.118 ± 0.003 Å |
c | 18.055 ± 0.004 Å |
α | 67.88 ± 0.03° |
β | 82.56 ± 0.03° |
γ | 70.67 ± 0.03° |
Cell volume | 2892.6 ± 1.3 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1139 |
Residual factor for significantly intense reflections | 0.0959 |
Weighted residual factors for significantly intense reflections | 0.2188 |
Weighted residual factors for all reflections included in the refinement | 0.2309 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.171 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1547088.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.