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Information card for entry 1547323
Preview
Coordinates | 1547323.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C27 H24 Cu N4 O6 Se |
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Calculated formula | C27 H24 Cu N4 O6 Se |
SMILES | [Se](=O)(=O)(O[Cu]12([n]3cccc4ccc5ccc[n]1c5c34)[n]1cccc3ccc4ccc[n]2c4c13)[O-].OCC(O)C |
Title of publication | Dielectric and ferroelectric sensing based on molecular recognition in Cu(1,10-phenlothroline)2SeO4.(diol) systems |
Authors of publication | Heng-Yun Ye; Wei-Qiang Liao; Qionghua Zhou; Yi Zhang; Jinlan Wang; Yu-Meng You; Jin-Yun Wang; Zhong-Ning Chen; Peng-Fei Li; Da-Wei Fu; Songping D. Huang; and Ren-Gen Xiong |
Journal of publication | Nature Communications |
Year of publication | 2017 |
Journal volume | 8 |
Pages of publication | 14551 |
a | 17.434 ± 0.019 Å |
b | 13.149 ± 0.012 Å |
c | 13.184 ± 0.014 Å |
α | 90° |
β | 123.634 ± 0.01° |
γ | 90° |
Cell volume | 2516 ± 4 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 6 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0458 |
Residual factor for significantly intense reflections | 0.0392 |
Weighted residual factors for significantly intense reflections | 0.1007 |
Weighted residual factors for all reflections included in the refinement | 0.1078 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.101 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1547323.html
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