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Information card for entry 1547428
Preview
Coordinates | 1547428.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C11 H12 N4 O2 S |
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Calculated formula | C11 H12 N4 O2 S |
SMILES | S(=O)(=O)(Nc1nc(ccn1)C)c1ccc(N)cc1 |
Title of publication | Sulfamerazine: Understanding the Influence of Slip Planes in the Polymorphic Phase Transformation through X-Ray Crystallographic Studies and ab Initio Lattice Dynamics |
Authors of publication | Anuradha R. Pallipurath; Jonathan M. Skelton; Mark R. Warren; Naghmeh Kamali; Patrick McArdle; Andrea Erxleben |
Journal of publication | Molecular Pharmaceutics |
Year of publication | 2015 |
Journal volume | 12 |
Pages of publication | 3735 - 3748 |
a | 14.504 ± 0.0002 Å |
b | 8.2162 ± 0.0001 Å |
c | 21.9984 ± 0.0004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2621.5 ± 0.07 Å3 |
Cell temperature | 300 K |
Ambient diffraction temperature | 300 K |
Number of distinct elements | 5 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0774 |
Residual factor for significantly intense reflections | 0.0498 |
Weighted residual factors for significantly intense reflections | 0.1382 |
Weighted residual factors for all reflections included in the refinement | 0.1661 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.933 |
Diffraction radiation wavelength | 0.6889 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1547428.html
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Users of the data should acknowledge the original authors of the
structural data.