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Information card for entry 1547996
Preview
Coordinates | 1547996.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C62 H77 N4 P4 Si4 Tb |
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Calculated formula | C62 H77 N4 P4 Si4 Tb |
SMILES | C12=P(c3ccccc3)(c3ccccc3)N([Si](C)(C)C)[Tb]32([N]([Si](C)(C)C)=P(c2ccccc2)(c2ccccc2)C=P(c2ccccc2)(c2ccccc2)N3[Si](C)(C)C)[N]([Si](C)(C)C)=P1(c1ccccc1)c1ccccc1 |
Title of publication | The inverse-trans-influence in tetravalent lanthanide and actinide bis(carbene) complexes |
Authors of publication | Matthew Gregson; Erli Lu; David P. Mills; Floriana Tuna; Eric J. L. McInnes; Christoph Hennig; Andreas C. Scheinost; Jonathan McMaster; William Lewis; Alexander J. Blake; Andrew Kerridge; Stephen T. Liddle |
Journal of publication | Nature Communications |
Year of publication | 2017 |
Journal volume | 8 |
Pages of publication | 14137 |
a | 31.7332 ± 0.0011 Å |
b | 25.7464 ± 0.0004 Å |
c | 20.982 ± 0.0008 Å |
α | 90° |
β | 132.711 ± 0.006° |
γ | 90° |
Cell volume | 12596.1 ± 1.4 Å3 |
Cell temperature | 120.01 ± 0.1 K |
Ambient diffraction temperature | 120.01 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0271 |
Residual factor for significantly intense reflections | 0.0244 |
Weighted residual factors for significantly intense reflections | 0.0602 |
Weighted residual factors for all reflections included in the refinement | 0.0616 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.02 |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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