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Information card for entry 1548000
Preview
Coordinates | 1548000.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C67 H88 Ce N4 P4 Si4 |
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Calculated formula | C67 H88 Ce N4 P4 Si4 |
SMILES | [Ce]1234([N](=P(C3=P(N1[Si](C)(C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C)[N](=P(C4=P(N2[Si](C)(C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[Si](C)(C)C.CCCCC |
Title of publication | The inverse-trans-influence in tetravalent lanthanide and actinide bis(carbene) complexes |
Authors of publication | Matthew Gregson; Erli Lu; David P. Mills; Floriana Tuna; Eric J. L. McInnes; Christoph Hennig; Andreas C. Scheinost; Jonathan McMaster; William Lewis; Alexander J. Blake; Andrew Kerridge; Stephen T. Liddle |
Journal of publication | Nature Communications |
Year of publication | 2017 |
Journal volume | 8 |
Pages of publication | 14137 |
a | 12.5621 ± 0.0002 Å |
b | 13.937 ± 0.0003 Å |
c | 21.4408 ± 0.0004 Å |
α | 95.8269 ± 0.0016° |
β | 101.874 ± 0.0014° |
γ | 109.053 ± 0.0017° |
Cell volume | 3414.01 ± 0.12 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0306 |
Residual factor for significantly intense reflections | 0.0293 |
Weighted residual factors for significantly intense reflections | 0.0749 |
Weighted residual factors for all reflections included in the refinement | 0.0761 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1548000.html
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