Information card for entry 1548666

Structure parameters

• Chemical name: Tetraphenylphosphonium tetrakis(trimethylsilanolato)ferrate(III)
• Formula: C36 H56 Fe O4 P Si4
• Calculated formula: C36 H56 Fe O4 P Si4
• SMILES: [Fe](O[Si](C)(C)C)(O[Si](C)(C)C)(O[Si](C)(C)C)O[Si](C)(C)C.[P+](c1ccccc1)(c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Tetraphenylphosphonium tetrakis(trimethylsilanolato)ferrate(III)
• Authors of publication: Hay, Michael T.; Yennawar, Hemant P.
• Journal of publication: IUCrData
• Year of publication: 2018
• Journal volume: 3
• Journal issue: 1
• Pages of publication: x171823
• a: 12.589 ± 0.007 Å
• b: 12.589 ± 0.007 Å
• c: 13.689 ± 0.007 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 2169 ± 2 ų
• Cell temperature: 223 ± 2 K
• Ambient diffraction temperature: 223 ± 2 K
• Number of distinct elements: 6
• Space group number: 82
• Hermann-Mauguin space group symbol: I -4
• Hall space group symbol: I -4
• Residual factor for all reflections: 0.044
• Residual factor for significantly intense reflections: 0.0361
• Weighted residual factors for significantly intense reflections: 0.075
• Weighted residual factors for all reflections included in the refinement: 0.078
• Goodness-of-fit parameter for all reflections included in the refinement: 0.916
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes