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Information card for entry 1549294
Preview
Coordinates | 1549294.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C29 H24 |
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Calculated formula | C29 H24 |
SMILES | c1(c(c2ccccc2c2cccc(c12)C)c1ccccc1)c1c(cccc1C)C |
Title of publication | Deciphering the working mechanism of aggregation-induced emission of tetraphenylethylene derivatives by ultrafast spectroscopy. |
Authors of publication | Cai, Yuanjing; Du, Lili; Samedov, Kerim; Gu, Xinggui; Qi, Fei; Sung, Herman H. Y.; Patrick, Brian O.; Yan, Zhiping; Jiang, Xiaofang; Zhang, Haoke; Lam, Jacky W. Y.; Williams, Ian D.; Lee Phillips, David; Qin, Anjun; Tang, Ben Zhong |
Journal of publication | Chemical science |
Year of publication | 2018 |
Journal volume | 9 |
Journal issue | 20 |
Pages of publication | 4662 - 4670 |
a | 7.396 ± 0.0002 Å |
b | 30.1314 ± 0.0011 Å |
c | 18.311 ± 0.0007 Å |
α | 90° |
β | 91.801 ± 0.003° |
γ | 90° |
Cell volume | 4078.6 ± 0.2 Å3 |
Cell temperature | 99.93 ± 0.16 K |
Ambient diffraction temperature | 99.93 ± 0.16 K |
Number of distinct elements | 2 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0904 |
Residual factor for significantly intense reflections | 0.0571 |
Weighted residual factors for significantly intense reflections | 0.1201 |
Weighted residual factors for all reflections included in the refinement | 0.1345 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1549294.html
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Users of the data should acknowledge the original authors of the
structural data.