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Information card for entry 1549632
Preview
Coordinates | 1549632.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49 H85 B Fe K N2 O P3 Si |
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Calculated formula | C49 H85 B Fe K N2 O P3 Si |
SMILES | [FeH]12([P](c3c(cccc3)[B](c3c([P]1(C(C)C)C(C)C)cccc3)(c1ccccc1[P](C(C)C)C(C)C)[H]2)(C(C)C)C(C)C)[N]1=[N]([Si](C(C)C)(C(C)C)C(C)C)[K]1[O]1CCCC1 |
Title of publication | Electrophile-promoted Fe-to-N<sub>2</sub> hydride migration in highly reduced Fe(N<sub>2</sub>)(H) complexes. |
Authors of publication | Deegan, Meaghan M.; Peters, Jonas C. |
Journal of publication | Chemical science |
Year of publication | 2018 |
Journal volume | 9 |
Journal issue | 29 |
Pages of publication | 6264 - 6270 |
a | 12.4653 ± 0.0018 Å |
b | 13.091 ± 0.003 Å |
c | 21.997 ± 0.003 Å |
α | 97.411 ± 0.01° |
β | 95.734 ± 0.004° |
γ | 117.826 ± 0.008° |
Cell volume | 3095 ± 1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 9 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0555 |
Residual factor for significantly intense reflections | 0.0397 |
Weighted residual factors for significantly intense reflections | 0.0957 |
Weighted residual factors for all reflections included in the refinement | 0.1014 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1549632.html
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