Information card for entry 1549714
Chemical name |
3',4'-Diphenyl-3<i>H</i>,4'<i>H</i>-spiro[benzo[<i>b</i>]thiophene-2,5'-isoxazol]-3-one |
Formula |
C22 H15 N O2 S |
Calculated formula |
C22 H15 N O2 S |
SMILES |
c12ccccc1C(=O)[C@@]1([C@H](C(c3ccccc3)=NO1)c1ccccc1)S2.c12ccccc1C(=O)[C@]1([C@@H](C(c3ccccc3)=NO1)c1ccccc1)S2 |
Title of publication |
3',4'-Diphenyl-3<i>H</i>,4'<i>H</i>-spiro[benzo[<i>b</i>]thiophene-2,5'-isoxazol]-3-one |
Authors of publication |
Bakhouch, Mohamed; El Yazidi, Mohamed; Al Houari, Ghali; Saadi, Mohamed; El Ammari, Lahcen |
Journal of publication |
IUCrData |
Year of publication |
2018 |
Journal volume |
3 |
Journal issue |
7 |
Pages of publication |
x181019 |
a |
9.265 ± 0.0002 Å |
b |
10.3523 ± 0.0002 Å |
c |
36.0698 ± 0.0008 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
3459.6 ± 0.13 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
61 |
Hermann-Mauguin space group symbol |
P b c a |
Hall space group symbol |
-P 2ac 2ab |
Residual factor for all reflections |
0.0799 |
Residual factor for significantly intense reflections |
0.0463 |
Weighted residual factors for significantly intense reflections |
0.0907 |
Weighted residual factors for all reflections included in the refinement |
0.1046 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.061 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/1549714.html