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Information card for entry 1550096
Preview
Coordinates | 1550096.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C41 H56 N8 O20 S4 |
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Calculated formula | C41 H56 N8 O20 S4 |
SMILES | c1cc(ccc1S(=O)(=O)[O-])C(c1ccc(cc1)S(=O)(=O)[O-])(c1ccc(cc1)S(=O)(=O)[O-])c1ccc(cc1)S(=O)(=O)[O-].[NH2+]=C(c1ccc(cc1)C(=[NH2+])N)N.O.O.c1c(C(=[NH2+])N)ccc(c1)C(=[NH2+])N.O.O.O.O.O.O |
Title of publication | Double Helix of Opposite Charges to Form Channels with Unique CO2 Selectivity and Dynamics |
Authors of publication | Sozzani, Piero; Xing, Guolong; Bassanetti, Irene; Bracco, Silvia; Negroni, Mattia; Bezuidenhout, Charl; Ben, Teng; Comotti, Angiolina |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 25.7276 ± 0.0005 Å |
b | 25.7276 ± 0.0005 Å |
c | 7.7202 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5110.1 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 88 |
Hermann-Mauguin space group symbol | I 41/a :2 |
Hall space group symbol | -I 4ad |
Residual factor for all reflections | 0.0503 |
Residual factor for significantly intense reflections | 0.0486 |
Weighted residual factors for significantly intense reflections | 0.1401 |
Weighted residual factors for all reflections included in the refinement | 0.1429 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.083 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.7 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1550096.html
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Users of the data should acknowledge the original authors of the
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