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Information card for entry 1550264
Preview
Coordinates | 1550264.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C113 H118 N4 O9 |
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Calculated formula | C113 H118 N4 O9 |
SMILES | O(C)c1ccccc1.O=C1N(C(=O)c2cc3c4c5c(cc6c7c5c(c5c4c2c1cc5)ccc7C(=O)N(C6=O)C(CCCCC)CCCCC)c1c3c2c3c4c5c6c7c(cc8c9c7c(c7c6c6c(c5)C(=O)N(C(=O)c6cc7)C(CCCCC)CCCCC)ccc9C(=O)N(C8=O)C(CCCCC)CCCCC)c4ccc3ccc2cc1)C(CCCCC)CCCCC |
Title of publication | Defying strain in the synthesis of an electroactive bilayer helicene |
Authors of publication | Milton, Margarita; Schuster, Nathaniel J.; Paley, Daniel W.; Hernández Sánchez, Raúl; Ng, Fay; Steigerwald, Michael L.; Nuckolls, Colin |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 15.2191 ± 0.0005 Å |
b | 16.2207 ± 0.0006 Å |
c | 19.6692 ± 0.0008 Å |
α | 75.736 ± 0.003° |
β | 74.285 ± 0.003° |
γ | 76.47 ± 0.003° |
Cell volume | 4456.7 ± 0.3 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1349 |
Residual factor for significantly intense reflections | 0.0947 |
Weighted residual factors for significantly intense reflections | 0.2589 |
Weighted residual factors for all reflections included in the refinement | 0.3043 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1550264.html
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Users of the data should acknowledge the original authors of the
structural data.