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Information card for entry 1550508
Preview
| Coordinates | 1550508.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H36 Cl2 Si Zr |
|---|---|
| Calculated formula | C26 H36 Cl2 Si Zr |
| SMILES | [c]123[c]4([c]5([c]67c(c(c(c([c]16[Zr]13457689([c]3([cH]6[cH]8[c]1([cH]39)CCCC)[Si]2(C)C)(Cl)Cl)C)C)C)C)C)C |
| Title of publication | Group 4 permethylindenyl complexes for slurry-phase polymerisation of ethylene |
| Authors of publication | Lamb, Jessica V.; Buffet, Jean-Charles; Turner, Zoë R.; O'Hare, Dermot |
| Journal of publication | Polymer Chemistry |
| Year of publication | 2019 |
| Journal volume | 10 |
| Journal issue | 11 |
| Pages of publication | 1386 |
| a | 8.7586 ± 0.0002 Å |
| b | 11.3702 ± 0.0003 Å |
| c | 14.6917 ± 0.0004 Å |
| α | 104.583 ± 0.002° |
| β | 94.052 ± 0.002° |
| γ | 103.622 ± 0.002° |
| Cell volume | 1362.94 ± 0.06 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 0.1 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0245 |
| Residual factor for significantly intense reflections | 0.0218 |
| Weighted residual factors for significantly intense reflections | 0.0545 |
| Weighted residual factors for all reflections included in the refinement | 0.0564 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1550508.html
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Users of the data should acknowledge the original authors of the
structural data.