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Information card for entry 1550510
Preview
Coordinates | 1550510.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H42 Si Zr |
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Calculated formula | C36 H42 Si Zr |
SMILES | [c]123[c]4([c]5([c]67[c]1(c(c(c(c6C)C)C)C)[Zr]16893457([c]3([cH]1[cH]6[cH]8[cH]93)[Si]2(C)C)(Cc1ccccc1)Cc1ccccc1)C)C |
Title of publication | Group 4 permethylindenyl complexes for slurry-phase polymerisation of ethylene |
Authors of publication | Lamb, Jessica V.; Buffet, Jean-Charles; Turner, Zoë R.; O'Hare, Dermot |
Journal of publication | Polymer Chemistry |
Year of publication | 2019 |
Journal volume | 10 |
Journal issue | 11 |
Pages of publication | 1386 |
a | 12.4776 ± 0.0006 Å |
b | 14.8663 ± 0.0012 Å |
c | 17.9117 ± 0.0005 Å |
α | 100.463 ± 0.005° |
β | 101.218 ± 0.004° |
γ | 105.208 ± 0.006° |
Cell volume | 3048.5 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 149.9 ± 0.3 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1746 |
Residual factor for significantly intense reflections | 0.1518 |
Weighted residual factors for significantly intense reflections | 0.3524 |
Weighted residual factors for all reflections included in the refinement | 0.3705 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.484 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1550510.html
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