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Information card for entry 1550743
Preview
Coordinates | 1550743.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C84 H138 Si7 |
---|---|
Calculated formula | C84 H138 Si7 |
SMILES | [Si]123[Si]([Si]41[Si]2([Si]([Si]34c1c(cc(cc1C(C)C)C(C)C)C(C)C)(c1c(cc(cc1C(C)C)C(C)C)C(C)C)c1c(cc(cc1C(C)C)C(C)C)C(C)C)c1c(cc(cc1C(C)C)C(C)C)C(C)C)([Si](C)(C)C)c1c(cc(cc1C(C)C)C(C)C)C(C)C.CCCCCC |
Title of publication | Site-Selective Functionalization of Si6R6 Siliconoids |
Authors of publication | Heider, Yannic; Poitiers, Nadine Elisabeth; Willmes, Philipp; Leszczynska, Kinga; Huch, Volker; Scheschkewitz, David |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 21.007 ± 0.0007 Å |
b | 20.4182 ± 0.0007 Å |
c | 19.9183 ± 0.0007 Å |
α | 90° |
β | 95.4324 ± 0.0013° |
γ | 90° |
Cell volume | 8505.1 ± 0.5 Å3 |
Cell temperature | 152 ± 2 K |
Ambient diffraction temperature | 152 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0737 |
Residual factor for significantly intense reflections | 0.0473 |
Weighted residual factors for significantly intense reflections | 0.1158 |
Weighted residual factors for all reflections included in the refinement | 0.1319 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1550743.html
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Users of the data should acknowledge the original authors of the
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