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Information card for entry 1551330
Preview
Coordinates | 1551330.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H84 N12 |
---|---|
Calculated formula | C72 H84 N12 |
SMILES | N1=Cc2cc3cc(c2)C=N[C@H]2[C@H](N=Cc4cc5cc(c4)C=N[C@@H]4CCCC[C@H]4N=Cc4cc(cc(c4)C=N[C@H]4[C@H](N=C3)CCCC4)C=N[C@@H]3CCCC[C@H]3N=Cc3cc(cc(c3)C=N[C@H]3[C@H]1CCCC3)C=N[C@@H]1CCCC[C@H]1N=C5)CCCC2 |
Title of publication | Trapping virtual pores by crystal retro-engineering |
Authors of publication | Marc A. Little; Michael E. Briggs; James T. A. Jones; Marc Schmidtmann; Tom Hasell; Samantha Y. Chong; Kim E. Jelfs; Linjiang Chen; Andrew I. Cooper |
Journal of publication | Nature Chemistry |
Year of publication | 2015 |
Journal volume | 7 |
Pages of publication | 153 - 159 |
a | 33.883 ± 0.008 Å |
b | 20.467 ± 0.005 Å |
c | 25.712 ± 0.006 Å |
α | 90° |
β | 95.249 ± 0.008° |
γ | 90° |
Cell volume | 17756 ± 7 Å3 |
Cell temperature | 300 ± 2 K |
Ambient diffraction temperature | 300 ± 2 K |
Number of distinct elements | 3 |
Space group number | 5 |
Hermann-Mauguin space group symbol | C 1 2 1 |
Hall space group symbol | C 2y |
Residual factor for all reflections | 0.1186 |
Residual factor for significantly intense reflections | 0.0907 |
Weighted residual factors for significantly intense reflections | 0.2331 |
Weighted residual factors for all reflections included in the refinement | 0.2673 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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