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Information card for entry 1551477
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Coordinates | 1551477.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 20180713-A2 |
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Formula | C48 H32 F2 N4 |
Calculated formula | C48 H32 F2 N4 |
SMILES | Fc1c(/C=C/c2cc(N(c3ccccc3)c3ccccc3)c(cc2N(c2ccccc2)c2ccccc2)/C=C/c2ccc(cc2F)C#N)ccc(c1)C#N |
Title of publication | Organic nanoparticles with ultrahigh stimulated emission depletion efficiency for low-power STED nanoscopy. |
Authors of publication | Man, Zhongwei; Lv, Zheng; Xu, Zhenzhen; Cui, Hongtu; Liao, Qing; Zheng, Lemin; Jin, Xue; He, Qihua; Fu, Hongbing |
Journal of publication | Nanoscale |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 27 |
Pages of publication | 12990 - 12996 |
a | 17.1059 ± 0.0004 Å |
b | 14.9921 ± 0.0004 Å |
c | 14.7772 ± 0.0004 Å |
α | 90° |
β | 95.317 ± 0.002° |
γ | 90° |
Cell volume | 3773.36 ± 0.17 Å3 |
Cell temperature | 296.96 ± 0.1 K |
Ambient diffraction temperature | 296.96 ± 0.1 K |
Number of distinct elements | 4 |
Space group number | 5 |
Hermann-Mauguin space group symbol | C 1 2 1 |
Hall space group symbol | C 2y |
Residual factor for all reflections | 0.0947 |
Residual factor for significantly intense reflections | 0.0863 |
Weighted residual factors for significantly intense reflections | 0.2855 |
Weighted residual factors for all reflections included in the refinement | 0.3057 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.33 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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