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Information card for entry 1551572
Preview
Coordinates | 1551572.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H58 N4 Ni2 O11 |
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Calculated formula | C44 H58 N4 Ni2 O11 |
SMILES | c12ccccc1C=[N]1CCOCCOCC[N]3=Cc4ccccc4O[Ni]4513[O]2[Ni]123([OH2]4)[N](=Cc4c(cccc4)[O]52)CCOCCOCC[N]1=Cc1ccccc1O3.OCC.OCC |
Title of publication | Di-μ-phenolato-μ-aqua-bridged Dinuclear Nickel(II) Complex with <i>N,N</i>′-Disalicylidene-2,2′-(ethylenedioxy)bis(ethylamine) |
Authors of publication | LIM, Jongwan; SHIN, Yunseok; HAN, Junhee; RYU, Sanghoon; MITSUHASHI, Ryoji; MIKURIYA, Masahiro |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2017 |
Journal volume | 33 |
Journal issue | 0 |
Pages of publication | 5 |
a | 18.321 ± 0.008 Å |
b | 13.543 ± 0.006 Å |
c | 18.649 ± 0.009 Å |
α | 90 ± 0.008° |
β | 108.372 ± 0.008° |
γ | 90 ± 0.009° |
Cell volume | 4391 ± 3 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0526 |
Residual factor for significantly intense reflections | 0.0347 |
Weighted residual factors for significantly intense reflections | 0.07 |
Weighted residual factors for all reflections included in the refinement | 0.0736 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.875 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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