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Information card for entry 1551576
Preview
Coordinates | 1551576.cif |
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Original paper (by DOI) | HTML |
Formula | C32 H30 N4 Ni O8 |
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Calculated formula | C32 H30 N4 Ni O8 |
SMILES | C1(C(c2ccc(cc2)OC)=[N]([Ni]2([N]=1O)N(=C(C(c1ccc(OC)cc1)=N2=O)c1ccc(OC)cc1)=O)O)c1ccc(cc1)OC |
Title of publication | Crystal Structure of the Bis[bis(<i>p</i>-methoxyphenyl)glyoximato]nickel(II) Complex |
Authors of publication | UEJI, Kan; SHINOZAKI, Satsuki; MIYAMURA, Kazuo |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2017 |
Journal volume | 33 |
Journal issue | 0 |
Pages of publication | 71 |
a | 17.6548 ± 0.0012 Å |
b | 19.0788 ± 0.0013 Å |
c | 9.2011 ± 0.0009 Å |
α | 90° |
β | 103.547 ± 0.002° |
γ | 90° |
Cell volume | 3013 ± 0.4 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.153 |
Residual factor for significantly intense reflections | 0.0683 |
Weighted residual factors for significantly intense reflections | 0.1454 |
Weighted residual factors for all reflections included in the refinement | 0.1821 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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