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Information card for entry 1551600
Preview
| Coordinates | 1551600.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C10 H28 Cl2 N2 O2 Ru S2 |
|---|---|
| Calculated formula | C10 H28 Cl2 N2 O2 Ru S2 |
| SMILES | [Ru]1(Cl)(Cl)([S](=O)(C)C)([S](=O)(C)C)[N](CC[N]1(C)C)(C)C |
| Title of publication | Crystal Structure of <i>Trans</i>(Cl),<i>cis</i>(S)-dichlorobis(dimethyl sulfoxide-<i>S</i>)(<i>N,N,N</i>′,<i>N</i>′-tetramethylethylenediamine)ruthenium(II) |
| Authors of publication | TOYAMA, Mari; IWATSUKI, Satoshi; NAGAO, Noriharu |
| Journal of publication | X-ray Structure Analysis Online |
| Year of publication | 2016 |
| Journal volume | 32 |
| Journal issue | 0 |
| Pages of publication | 25 |
| a | 8.616 ± 0.005 Å |
| b | 22.925 ± 0.012 Å |
| c | 8.991 ± 0.005 Å |
| α | 90° |
| β | 94.415 ± 0.006° |
| γ | 90° |
| Cell volume | 1770.6 ± 1.7 Å3 |
| Cell temperature | 173 K |
| Ambient diffraction temperature | 173 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0668 |
| Residual factor for significantly intense reflections | 0.054 |
| Weighted residual factors for significantly intense reflections | 0.1305 |
| Weighted residual factors for all reflections included in the refinement | 0.1359 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71075 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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