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Information card for entry 1551754
Preview
Coordinates | 1551754.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C61 H66 N4 Si |
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Calculated formula | C61 H66 N4 Si |
SMILES | C(#CC1=c2ccc(=C(c3ccc(n3)=C(c3[nH]c(cc3)C(=c3nc1cc3)c1cc(C(C)(C)C)cc(C(C)(C)C)c1)C#Cc1ccccc1)c1cc(cc(c1)C(C)(C)C)C(C)(C)C)[nH]2)[Si](C)(C)C |
Title of publication | Synthesis and Crystal Structure of 5,15-Bis(3,5-di-tert-butylphenyl)-10-(phenylethynyl)-20-(trimethylsilylethynyl)porphyrin |
Authors of publication | SINGH, Atul P.; KIM, Hee-Joon |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2010 |
Journal volume | 26 |
Pages of publication | 23 |
a | 8.9729 ± 0.001 Å |
b | 19.167 ± 0.002 Å |
c | 20.763 ± 0.002 Å |
α | 65.932 ± 0.002° |
β | 81.356 ± 0.002° |
γ | 86.051 ± 0.002° |
Cell volume | 3223.3 ± 0.6 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1474 |
Residual factor for significantly intense reflections | 0.098 |
Weighted residual factors for significantly intense reflections | 0.2531 |
Weighted residual factors for all reflections included in the refinement | 0.2801 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.916 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1551754.html
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