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Information card for entry 1551763
Preview
Coordinates | 1551763.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C31 H75 Cl4 N2 O0.5 P3 Pt3 Se2 |
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Calculated formula | C31 H75 Cl4 N2 O0.5 P3 Pt3 Se2 |
SMILES | C(CC)[P](CCC)(CCC)[Pt]1([NH2]CC[Se]1[Pt]1([NH2]CC[Se]1[Pt]([P](CCC)(CCC)CCC)(Cl)Cl)[P](CCC)(CCC)CCC)Cl.[Cl-].O |
Title of publication | Crystal Structure of [Pt3Cl3(μ-SeCH2CH2NH2)2(PPr3)3]Cl |
Authors of publication | KUMBHARE, Liladhar B.; WADAWALE, Amey; JAIN, Vimal K. |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2010 |
Journal volume | 26 |
Pages of publication | 69 |
a | 10.969 ± 0.003 Å |
b | 15.39 ± 0.005 Å |
c | 18.197 ± 0.003 Å |
α | 68.46 ± 0.017° |
β | 82.365 ± 0.017° |
γ | 70.17 ± 0.02° |
Cell volume | 2687.8 ± 1.3 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.127 |
Residual factor for significantly intense reflections | 0.059 |
Weighted residual factors for significantly intense reflections | 0.1648 |
Weighted residual factors for all reflections included in the refinement | 0.1845 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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