Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1551822
Preview
Coordinates | 1551822.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Er3N@Cs-C84 Ni(OEP) |
---|---|
Chemical name | Er3N@Cs-C84 Ni(OEP) |
Formula | C131.05 H54.85 Er3 N5 Ni S0.38 |
Calculated formula | C131.05 H54.86 Er3.0001 N5 Ni1.08 S0.38 |
Title of publication | Crystallographic characterization of Er<sub>3</sub>N@C<sub>2n</sub> (2n = 80, 82, 84, 88): the importance of a planar Er<sub>3</sub>N cluster. |
Authors of publication | Hu, Shuaifeng; Zhao, Pei; Shen, Wangqiang; Yu, Pengyuan; Huang, Wenhuan; Ehara, Masahiro; Xie, Yunpeng; Akasaka, Takeshi; Lu, Xing |
Journal of publication | Nanoscale |
Year of publication | 2019 |
Journal volume | 11 |
Journal issue | 28 |
Pages of publication | 13415 - 13422 |
a | 14.5795 ± 0.0002 Å |
b | 14.9763 ± 0.0002 Å |
c | 19.7722 ± 0.0003 Å |
α | 84.96 ± 0.001° |
β | 89.147 ± 0.001° |
γ | 62.37° |
Cell volume | 3808.45 ± 0.09 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0767 |
Residual factor for significantly intense reflections | 0.0743 |
Weighted residual factors for significantly intense reflections | 0.1892 |
Weighted residual factors for all reflections included in the refinement | 0.1913 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.6525 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1551822.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.