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Information card for entry 1551975
Preview
Coordinates | 1551975.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49.81 H53.02 Cl6.65 N7.3 O1.28 Pd3 |
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Calculated formula | C49.5615 H49.6113 Cl6.6515 N7.29975 O1.03075 Pd3 |
SMILES | c12ccccc1[NH]1Cc3ccc(cc3)C[NH]3c4ccccc4[NH](Cc4ccc(cc4)C[NH]4c5ccccc5[NH](Cc5ccc(cc5)C[NH]2[Pd]1(Cl)Cl)[Pd]4(Cl)Cl)[Pd]3(Cl)Cl.c1(cc(ccc1)[C@@H](C)O)Cl.C(#N)C.C(#N)C.O |
Title of publication | In situ X-ray snapshot analysis of transient molecular adsorption in a crystalline channel |
Authors of publication | Ryou Kubota; Shohei Tashiro; Motoo Shiro; Mitsuhiko Shionoya |
Journal of publication | Nature Chemistry |
Year of publication | 2014 |
Journal volume | 6 |
Pages of publication | 913 - 918 |
a | 14.3263 ± 0.0003 Å |
b | 52.7504 ± 0.001 Å |
c | 19.746 ± 0.0004 Å |
α | 90° |
β | 90.666 ± 0.001° |
γ | 90° |
Cell volume | 14921.4 ± 0.5 Å3 |
Cell temperature | 93 ± 2 K |
Ambient diffraction temperature | 93 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.109 |
Residual factor for significantly intense reflections | 0.0676 |
Weighted residual factors for significantly intense reflections | 0.1753 |
Weighted residual factors for all reflections included in the refinement | 0.2039 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.987 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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