Information card for entry 1552087

Structure parameters

• Common name: ZSM-5
• Chemical name: Si-MFI
• Formula: O192 Si96
• Calculated formula: O192 Si96
• Title of publication: Automated serial rotation electron diffraction combined with cluster analysis: an efficient multi-crystal workflow for structure determination
• Authors of publication: Wang, Bin; Zou, Xiaodong; Smeets, Stef
• Journal of publication: IUCrJ
• Year of publication: 2019
• Journal volume: 6
• Journal issue: 5
• a: 19.98 Å
• b: 20.43 Å
• c: 13.61 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5555.48 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 2
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.2603
• Residual factor for significantly intense reflections: 0.2178
• Weighted residual factors for significantly intense reflections: 0.5024
• Weighted residual factors for all reflections included in the refinement: 0.5448
• Goodness-of-fit parameter for all reflections included in the refinement: 1.405
• Diffraction radiation wavelength: 0.0251 Å
• Diffraction radiation type: electron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No