Information card for entry 1552089

Structure parameters

• Common name: ZSM-5
• Chemical name: Si-MFI
• Formula: O192 Si96
• Calculated formula: O192 Si96
• Title of publication: Automated serial rotation electron diffraction combined with cluster analysis: an efficient multi-crystal workflow for structure determination
• Authors of publication: Wang, Bin; Zou, Xiaodong; Smeets, Stef
• Journal of publication: IUCrJ
• Year of publication: 2019
• Journal volume: 6
• Journal issue: 5
• a: 20.39 Å
• b: 20.08 Å
• c: 13.57 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5555.98 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 2
• Space group number: 62
• Hermann-Mauguin space group symbol: P n m a
• Hall space group symbol: -P 2ac 2n
• Residual factor for all reflections: 0.2273
• Residual factor for significantly intense reflections: 0.196
• Weighted residual factors for significantly intense reflections: 0.446
• Weighted residual factors for all reflections included in the refinement: 0.4735
• Goodness-of-fit parameter for all reflections included in the refinement: 1.075
• Diffraction radiation wavelength: 0.0251 Å
• Diffraction radiation type: electron
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No