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Information card for entry 1552108
Preview
Coordinates | 1552108.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H71 O19 P V6 |
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Calculated formula | C32 H71 O19 P V6 |
SMILES | CP(=[O][V]1234[O](CC)[V]567([O](CC)[V]89%10([O]([V]%11([O](CC)[V]%12([O]8CC)([O]2CC)([O]([V]([O]9CC)([O]1CC)([O]5CC)([O]47%10%11%12)=O)CC)=O)([O]3CC)([O]6CC)=O)CC)=O)=O)(C)c1ccccc1 |
Title of publication | Oxygen atom transfer with organofunctionalized polyoxovanadium clusters: O-atom vacancy formation with tertiary phosphines and deoxygenation of styrene oxide |
Authors of publication | Petel, Brittney E.; Meyer, Rachel L.; Brennessel, William W.; Matson, Ellen |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 20.7441 ± 0.0003 Å |
b | 10.7498 ± 0.00016 Å |
c | 21.6524 ± 0.0003 Å |
α | 90° |
β | 101.754 ± 0.0014° |
γ | 90° |
Cell volume | 4727.14 ± 0.12 Å3 |
Cell temperature | 100 ± 0.3 K |
Ambient diffraction temperature | 100 ± 0.3 K |
Number of distinct elements | 5 |
Space group number | 9 |
Hermann-Mauguin space group symbol | C 1 c 1 |
Hall space group symbol | C -2yc |
Residual factor for all reflections | 0.0584 |
Residual factor for significantly intense reflections | 0.0568 |
Weighted residual factors for significantly intense reflections | 0.1553 |
Weighted residual factors for all reflections included in the refinement | 0.1568 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1552108.html
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Users of the data should acknowledge the original authors of the
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