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Information card for entry 1552110
Preview
Coordinates | 1552110.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H51 O19 P V6 |
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Calculated formula | C30 H51 O19 P V6 |
SMILES | [V]1234([O]=P(c5ccccc5)(c5ccccc5)c5ccccc5)[O]([V]567(=O)[O]([V]89(=O)([O]1C)[O]([V]1%10(=O)([O]2C)[O]([V]2(=O)([O]3C)([O]5C)[O]([V](=O)([O]6C)([O]8C)([O]1C)[O]479%102)C)C)C)C)C |
Title of publication | Oxygen atom transfer with organofunctionalized polyoxovanadium clusters: O-atom vacancy formation with tertiary phosphines and deoxygenation of styrene oxide |
Authors of publication | Petel, Brittney E.; Meyer, Rachel L.; Brennessel, William W.; Matson, Ellen |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 13.7288 ± 0.0001 Å |
b | 16.0095 ± 0.0001 Å |
c | 18.8692 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4147.28 ± 0.06 Å3 |
Cell temperature | 100 ± 0.5 K |
Ambient diffraction temperature | 100 ± 0.5 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0417 |
Residual factor for significantly intense reflections | 0.0395 |
Weighted residual factors for significantly intense reflections | 0.1074 |
Weighted residual factors for all reflections included in the refinement | 0.1088 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.09 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1552110.html
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