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Information card for entry 1552205
Preview
Coordinates | 1552205.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 5,15-dimesityl-10,20-bis((trimethylsilyl)ethynyl)porphyrin |
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Formula | C52 H58 N5 Si2 |
Calculated formula | C52 H58 N5 Si2 |
SMILES | [Si](C)(C#CC1=c2[nH]c(=C(c3c(cc(cc3C)C)C)c3nc(=C(c4[nH]c(C(=c5nc1cc5)c1c(cc(cc1C)C)C)cc4)C#C[Si](C)(C)C)cc3)cc2)(C)C.N1CCCC1 |
Title of publication | Unravelling the conductance path through single-porphyrin junctions |
Authors of publication | El Abbassi, Maria; Zwick, Patrick; Rates, Alfredo; Stefani, Davide; Prescimone, Alessandro; Mayor, Marcel; van der Zant, Herre S. J.; Dulić, Diana |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 11.2455 ± 0.0005 Å |
b | 14.4419 ± 0.0006 Å |
c | 14.439 ± 0.0006 Å |
α | 90° |
β | 99.887 ± 0.003° |
γ | 90° |
Cell volume | 2310.16 ± 0.17 Å3 |
Cell temperature | 123 K |
Ambient diffraction temperature | 123 K |
Number of distinct elements | 4 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0641 |
Residual factor for significantly intense reflections | 0.059 |
Weighted residual factors for all reflections | 0.1446 |
Weighted residual factors for significantly intense reflections | 0.1414 |
Weighted residual factors for all reflections included in the refinement | 0.1446 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9484 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1552205.html
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Users of the data should acknowledge the original authors of the
structural data.