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Information card for entry 1552338
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Coordinates | 1552338.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [Yb(Ntt)2(F)] |
---|---|
Formula | C36 H84 F N2 Si4 Yb |
Calculated formula | C36 H84 F N2 Si4 Yb |
SMILES | [Yb](F)(N([Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C)N([Si](C(C)C)(C(C)C)C(C)C)[Si](C(C)C)(C(C)C)C(C)C |
Title of publication | Electronic Structures of Bent Lanthanide(III) Complexes with Two N-Donor Ligands |
Authors of publication | Nicholas, Hannah; Vonci, Michele; Goodwin, Conrad Alexander Phillip; Loo, Song Wei; Murphy, Siobhan; Cassim, Daniel; Winpenny, Richard E. P.; McInnes, Eric J. L.; Chilton, Nicholas F.; Mills, David P. |
Journal of publication | Chemical Science |
Year of publication | 2019 |
a | 8.7293 ± 0.0003 Å |
b | 11.1712 ± 0.0004 Å |
c | 24.4919 ± 0.0008 Å |
α | 84.182 ± 0.003° |
β | 80.59 ± 0.003° |
γ | 68.517 ± 0.003° |
Cell volume | 2190.3 ± 0.14 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0376 |
Residual factor for significantly intense reflections | 0.0355 |
Weighted residual factors for significantly intense reflections | 0.0925 |
Weighted residual factors for all reflections included in the refinement | 0.0937 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1552338.html
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