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Information card for entry 1552776
Preview
Coordinates | 1552776.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H36 Ag6 N6 S6 |
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Calculated formula | C54 H36 Ag6 N6 S6 |
SMILES | [S]12[Ag]3[n]4c([S]5[Ag]([S]6c7[n]([Ag]1[S]1[Ag]8[S]3c3ccc9ccccc9[n]3[Ag]5[S]([Ag]6[n]3c1ccc1ccccc31)c1ccc3ccccc3[n]81)c1c(cccc1)cc7)[n]1c2ccc2c1cccc2)ccc1c4cccc1 |
Title of publication | Crystal Structure of Hexakis(quinoline-2-thiolatosilver(I)) |
Authors of publication | OZAWA, Yoshiki; MASUNAGA, Azusa; KUBO, Masahiro; YASUDA, Nobuhiro; TORIUMI, Koshiro |
Journal of publication | X-ray Structure Analysis Online |
Year of publication | 2019 |
Journal volume | 35 |
Journal issue | 0 |
Pages of publication | 51 |
a | 8.064 ± 0.006 Å |
b | 13.48 ± 0.003 Å |
c | 13.573 ± 0.005 Å |
α | 113.528 ± 0.015° |
β | 104.24 ± 0.03° |
γ | 100.46 ± 0.03° |
Cell volume | 1244.5 ± 1.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0437 |
Residual factor for significantly intense reflections | 0.0324 |
Weighted residual factors for significantly intense reflections | 0.075 |
Weighted residual factors for all reflections included in the refinement | 0.0889 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.116 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.83073 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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