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Information card for entry 1552916
Preview
Coordinates | 1552916.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C30 H26 |
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Calculated formula | C30 H26 |
Title of publication | Highly Emissive Hierarchical Uniform Dialkylfluorene-Based Dimer Microcrystals for Ultraviolet Organic Laser |
Authors of publication | Zhu, Wen-Sai; Han, Ya-Min; An, Xiang; Weng, Jie-Na; Yu, Meng-Na; Bai, Lu-Bing; Wei, Chuan-Xin; Lin, Jin-Yi; Liu, Wei; Ou, Chang-Jin; Xie, Ling-Hai; Ding, Xue-Hua; Zhao, Jian-Feng; Xu, Chun-Xiang; Huang, Wei |
Journal of publication | The Journal of Physical Chemistry C |
Year of publication | 2019 |
a | 8.39 ± 0.003 Å |
b | 9.828 ± 0.003 Å |
c | 13.251 ± 0.004 Å |
α | 79.129 ± 0.011° |
β | 87.424 ± 0.007° |
γ | 89.762 ± 0.007° |
Cell volume | 1071.9 ± 0.6 Å3 |
Cell temperature | 293.15 K |
Ambient diffraction temperature | 293.15 K |
Number of distinct elements | 2 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1248 |
Residual factor for significantly intense reflections | 0.0978 |
Weighted residual factors for significantly intense reflections | 0.2525 |
Weighted residual factors for all reflections included in the refinement | 0.2849 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1552916.html
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