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Information card for entry 1553245
Preview
Coordinates | 1553245.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C37 H28 O |
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Calculated formula | C37 H28 O |
SMILES | O=C1[C@]2(C(=C([C@@]1([C@@H](C2)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.O=C1[C@@]2(C(=C([C@]1([C@H](C2)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | Illustrating the Utility of X-ray Crystallography for Structure Elucidation through a Tandem Aldol Condensation/Diels‒Alder Reaction Sequence |
Authors of publication | Hoang, Giang T.; Kubo, Tomohiro; Young, Victor G.; Kautzky, Jacob A.; Wissinger, Jane E. |
Journal of publication | Journal of Chemical Education |
Year of publication | 2015 |
Journal volume | 92 |
Journal issue | 8 |
Pages of publication | 1381 |
a | 10.6896 ± 0.0009 Å |
b | 11.5817 ± 0.001 Å |
c | 12.2608 ± 0.0015 Å |
α | 118.181 ± 0.001° |
β | 94.775 ± 0.002° |
γ | 99.292 ± 0.002° |
Cell volume | 1298.1 ± 0.2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0768 |
Residual factor for significantly intense reflections | 0.0465 |
Weighted residual factors for significantly intense reflections | 0.1037 |
Weighted residual factors for all reflections included in the refinement | 0.1154 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/1553245.html
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Users of the data should acknowledge the original authors of the
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