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Information card for entry 1553666
Preview
Coordinates | 1553666.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H14 Hg I2 N2 S2 |
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Calculated formula | C20 H14 Hg I2 N2 S2 |
SMILES | C1(=C(c2cccs2)c2cccs2)c2cccc[n]2[Hg](I)(I)[n]2c1cccc2 |
Title of publication | A turn-on AIE active fluorescent sensor for Hg2+ by combination of 1,1-bis(2-pyridyl)ethylene and thiophene/bithiophene fragments |
Authors of publication | Gabr, Moustafa T.; Christopher Pigge, F. |
Journal of publication | Materials Chemistry Frontiers |
Year of publication | 2017 |
Journal volume | 1 |
Journal issue | 8 |
Pages of publication | 1654 |
a | 10.2226 ± 0.001 Å |
b | 10.3008 ± 0.001 Å |
c | 12.2126 ± 0.0012 Å |
α | 74.477 ± 0.005° |
β | 67.707 ± 0.005° |
γ | 71.185 ± 0.005° |
Cell volume | 1110.69 ± 0.19 Å3 |
Cell temperature | 190 ± 2 K |
Ambient diffraction temperature | 190.15 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0275 |
Residual factor for significantly intense reflections | 0.0211 |
Weighted residual factors for significantly intense reflections | 0.0429 |
Weighted residual factors for all reflections included in the refinement | 0.0478 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.155 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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The link is: https://www.crystallography.net/1553666.html
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