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Information card for entry 1554027
Preview
| Coordinates | 1554027.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | triphenyl bismuth |
|---|---|
| Formula | C18 H15 Bi |
| Calculated formula | C18 H15 Bi |
| SMILES | [Bi](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Importance of Relativistic Effects and Electron Correlation in Structure Factors and Electron Density of Diphenyl Mercury and Triphenyl Bismuth. |
| Authors of publication | Bučinský, Lukáš; Jayatilaka, Dylan; Grabowsky, Simon |
| Journal of publication | The journal of physical chemistry. A |
| Year of publication | 2016 |
| Journal volume | 120 |
| Journal issue | 33 |
| Pages of publication | 6650 - 6669 |
| a | 26.5617 ± 0.0007 Å |
| b | 5.7076 ± 0.0001 Å |
| c | 20.2096 ± 0.0006 Å |
| α | 90° |
| β | 109.72 ± 0.003° |
| γ | 90° |
| Cell volume | 2884.16 ± 0.14 Å3 |
| Cell temperature | 104 ± 8 K |
| Ambient diffraction temperature | 104 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | I 1 2/a 1 |
| Hall space group symbol | -I 2ya |
| Residual factor for all reflections | 0.0383 |
| Residual factor for significantly intense reflections | 0.0295 |
| Weighted residual factors for significantly intense reflections | 0.0598 |
| Weighted residual factors for all reflections included in the refinement | 0.063 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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