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Information card for entry 1554103
Preview
| Coordinates | 1554103.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H44 Cl6 O4 Sb |
|---|---|
| Calculated formula | C48 H44 Cl6 O4 Sb |
| SMILES | O(c1cc2C3(C)c4c(C(C)(c2cc1OC)c1c3cccc1)cccc4)C.[Cl-][Sb](Cl)(Cl)(Cl)(Cl)Cl.C12(C)c3c(C(C)(c4c1cccc4)c1c2cccc1)cc(OC)c(OC)c3 |
| Title of publication | Probing Charge Delocalization in Solid State Polychromophoric Cation Radicals Using X-ray Crystallography and DFT Calculations |
| Authors of publication | Ivanova, Lena V.; Wang, Denan; Lindeman, Sergey; Ivanov, Maxim V.; Rathore, Rajendra |
| Journal of publication | The Journal of Physical Chemistry C |
| Year of publication | 2018 |
| Journal volume | 122 |
| Journal issue | 17 |
| Pages of publication | 9339 |
| a | 8.0069 ± 0.0008 Å |
| b | 15.6265 ± 0.0016 Å |
| c | 17.2565 ± 0.0018 Å |
| α | 90° |
| β | 95.002 ± 0.002° |
| γ | 90° |
| Cell volume | 2150.9 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0729 |
| Residual factor for significantly intense reflections | 0.0415 |
| Weighted residual factors for significantly intense reflections | 0.0851 |
| Weighted residual factors for all reflections included in the refinement | 0.0965 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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