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Information card for entry 1554196
Preview
| Coordinates | 1554196.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H52 N2 O4 |
|---|---|
| Calculated formula | C52 H51 N2 O4 |
| SMILES | O=C1N(C(=O)c2c3c(c4c2c2c1c1c(c2C(=O)N(C4=O)CCCCCCCC)ccc(cc1)c1ccccc1)ccc(cc3)c1ccccc1)CCCCCCCC |
| Title of publication | 6,6′-Diaryl-substituted biazulene diimides for solution-processable high-performance n-type organic semiconductors |
| Authors of publication | Xin, Hanshen; Li, Jing; Ge, Congwu; Yang, Xiaodi; Xue, Tianrui; Gao, Xike |
| Journal of publication | Materials Chemistry Frontiers |
| Year of publication | 2018 |
| Journal volume | 2 |
| Journal issue | 5 |
| Pages of publication | 975 |
| a | 13.3247 ± 0.0007 Å |
| b | 16.6349 ± 0.0009 Å |
| c | 19.0232 ± 0.0008 Å |
| α | 93.227 ± 0.003° |
| β | 97.302 ± 0.003° |
| γ | 103.143 ± 0.003° |
| Cell volume | 4057 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1758 |
| Residual factor for significantly intense reflections | 0.0976 |
| Weighted residual factors for significantly intense reflections | 0.2346 |
| Weighted residual factors for all reflections included in the refinement | 0.2647 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.347 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1554196.html
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