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Information card for entry 1554276
Preview
| Coordinates | 1554276.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H49 Cl2 N3 O3 Ru S |
|---|---|
| Calculated formula | C42 H49 Cl2 N3 O3 Ru S |
| SMILES | [Ru]1(Cl)(Cl)([O]=S(=O)(N(C=1C1=CCC(C1O)(C)C)c1ccccc1)c1ccc(cc1)C)=C1N(c2c(cc(cc2C)C)C)CCN1c1c(cc(cc1C)C)C |
| Title of publication | A general approach for the formation of oxygen-chelated ruthenium alkylidene complexes relying on the Thorpe‒Ingold effect |
| Authors of publication | Sabbasani, Venkata R.; Gupta, Saswata; Young Yun, Sang; Lee, Daesung |
| Journal of publication | Organic Chemistry Frontiers |
| Year of publication | 2018 |
| Journal volume | 5 |
| Journal issue | 9 |
| Pages of publication | 1532 |
| a | 13.3662 ± 0.0008 Å |
| b | 19.3514 ± 0.0012 Å |
| c | 18.2778 ± 0.0011 Å |
| α | 90° |
| β | 107.451 ± 0.002° |
| γ | 90° |
| Cell volume | 4510 ± 0.5 Å3 |
| Cell temperature | 300 ± 2 K |
| Ambient diffraction temperature | 300.15 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0556 |
| Residual factor for significantly intense reflections | 0.0425 |
| Weighted residual factors for significantly intense reflections | 0.1139 |
| Weighted residual factors for all reflections included in the refinement | 0.1226 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.0356 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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