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Information card for entry 1554654
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Coordinates | 1554654.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | d-DPE |
---|---|
Formula | C20 H24 |
Calculated formula | C20 H24 |
SMILES | c1(c(cc(c(c1)C)C)C)/C=C/c1c(cc(c(c1)C)C)C |
Title of publication | Drawing a clear mechanistic picture for the aggregation-induced emission process |
Authors of publication | Zhang, Haoke; Liu, Junkai; Du, Lili; Ma, Chao; Leung, Nelson L. C.; Niu, Yingli; Qin, Anjun; Sun, Jingzhi; Peng, Qian; Sung, Herman H. Y.; Williams, Ian D.; Kwok, Ryan T. K.; Lam, Jacky W. Y.; Wong, Kam Sing; Phillips, David Lee; Tang, Ben Zhong |
Journal of publication | Materials Chemistry Frontiers |
Year of publication | 2019 |
Journal volume | 3 |
Journal issue | 6 |
Pages of publication | 1143 |
a | 4.7535 ± 0.0005 Å |
b | 6.1267 ± 0.0013 Å |
c | 13.209 ± 0.002 Å |
α | 96.215 ± 0.015° |
β | 96.738 ± 0.011° |
γ | 91.369 ± 0.013° |
Cell volume | 379.53 ± 0.11 Å3 |
Cell temperature | 100.01 ± 0.01 K |
Ambient diffraction temperature | 100.01 ± 0.01 K |
Number of distinct elements | 2 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0868 |
Residual factor for significantly intense reflections | 0.0581 |
Weighted residual factors for significantly intense reflections | 0.1305 |
Weighted residual factors for all reflections included in the refinement | 0.1498 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.002 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1554654.html
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Users of the data should acknowledge the original authors of the
structural data.