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Information card for entry 1554656
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Coordinates | 1554656.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | TPh-TM |
---|---|
Formula | C24 H26 |
Calculated formula | C24 H26 |
SMILES | c1(cc(c(cc1c1ccc(c2c(cc(c(c2)C)C)C)cc1)C)C)C |
Title of publication | Drawing a clear mechanistic picture for the aggregation-induced emission process |
Authors of publication | Zhang, Haoke; Liu, Junkai; Du, Lili; Ma, Chao; Leung, Nelson L. C.; Niu, Yingli; Qin, Anjun; Sun, Jingzhi; Peng, Qian; Sung, Herman H. Y.; Williams, Ian D.; Kwok, Ryan T. K.; Lam, Jacky W. Y.; Wong, Kam Sing; Phillips, David Lee; Tang, Ben Zhong |
Journal of publication | Materials Chemistry Frontiers |
Year of publication | 2019 |
Journal volume | 3 |
Journal issue | 6 |
Pages of publication | 1143 |
a | 7.9294 ± 0.0008 Å |
b | 7.3834 ± 0.0007 Å |
c | 16.2178 ± 0.0015 Å |
α | 90° |
β | 90.745 ± 0.008° |
γ | 90° |
Cell volume | 949.41 ± 0.16 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293.15 K |
Number of distinct elements | 2 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0686 |
Residual factor for significantly intense reflections | 0.0497 |
Weighted residual factors for significantly intense reflections | 0.1315 |
Weighted residual factors for all reflections included in the refinement | 0.1493 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1554656.html
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Users of the data should acknowledge the original authors of the
structural data.