Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1554856
Preview
Coordinates | 1554856.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H26 N2 O8 Si |
---|---|
Calculated formula | C20 H26 N2 O8 Si |
SMILES | c1c(C(=O)O[C@@H]2CCC(=O)O[C@H]2/C=C/[Si](CC)(CC)CC)cc(N(=O)=O)cc1N(=O)=O.c1c(C(=O)O[C@H]2CCC(=O)O[C@@H]2/C=C/[Si](CC)(CC)CC)cc(N(=O)=O)cc1N(=O)=O |
Title of publication | Synthesis of functionalized γ-lactone via Sakurai exo-cyclization/rearrangement of 3,3-bis(silyl) enol ester with a tethered acetal. |
Authors of publication | Yin, Zhiping; Liu, Zengjin; Huang, Zhenggang; Chu, Yang; Chu, Zhiwen; Hu, Jia; Gao, Lu; Song, Zhenlei |
Journal of publication | Organic letters |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 6 |
Pages of publication | 1553 - 1556 |
a | 18.687 ± 0.007 Å |
b | 6.709 ± 0.002 Å |
c | 37.603 ± 0.013 Å |
α | 90° |
β | 90.534 ± 0.004° |
γ | 90° |
Cell volume | 4714 ± 3 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296.15 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1503 |
Residual factor for significantly intense reflections | 0.0814 |
Weighted residual factors for significantly intense reflections | 0.2045 |
Weighted residual factors for all reflections included in the refinement | 0.2506 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1554856.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.