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Information card for entry 1555333
Preview
Coordinates | 1555333.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H36 F4 N2 O4 Si2 |
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Calculated formula | C44 H36 F4 N2 O4 Si2 |
SMILES | C1(=O)[C@H]2[C@H]3C=C[C@@H]([C@H]2C(=O)N1c1c(F)cccc1F)c1c3c(c2[C@@H]3C=C[C@@H]([C@H]4C(=O)N(C(=O)[C@@H]34)c3c(F)cccc3F)c2c1C#C[Si](C)(C)C)C#C[Si](C)(C)C |
Title of publication | Lewis Acid Assisted Diels-Alder Reaction with Regio- and Stereoselectivity: Anti-1,4-Adducts with Rigid Scaffolds and Their Application in Explosives Sensing. |
Authors of publication | Chen, Qi; Chen, Hao; Meng, Xiao; Ma, Yuguo |
Journal of publication | Organic letters |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 20 |
Pages of publication | 5016 - 5019 |
a | 6.2172 ± 0.0005 Å |
b | 11.8634 ± 0.001 Å |
c | 29.226 ± 0.002 Å |
α | 90° |
β | 94.257 ± 0.007° |
γ | 90° |
Cell volume | 2149.7 ± 0.3 Å3 |
Cell temperature | 180 ± 0.1 K |
Ambient diffraction temperature | 180 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1105 |
Residual factor for significantly intense reflections | 0.0625 |
Weighted residual factors for significantly intense reflections | 0.1376 |
Weighted residual factors for all reflections included in the refinement | 0.1568 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.042 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1555333.html
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Users of the data should acknowledge the original authors of the
structural data.