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Information card for entry 1555342
Preview
Coordinates | 1555342.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C80 H24 O |
---|---|
Calculated formula | C80 H24 O |
SMILES | c1(ccccc1)CC12c3c4C5(C6C(=O)CCCC6)c6c1c1c7c2c2c8c9c7c7c%10c%11c%12c%13c%14c%15c%16c(c6c%14c1c7%13)c5c1c5c4c4c3c2c2c8c3c(c9%10)c6c%11c7c8c9c(c%16c1c1c5c5c4c2c2c5c(c91)c8c6c32)c%15c%127.c1(ccccc1)C |
Title of publication | Base-Promoted Consecutive Enolate Addition Reaction of [60]Fullerene with Ketones. |
Authors of publication | Chen, Si; Li, Zong-Jun; Li, Shu-Hui; Gao, Xiang |
Journal of publication | Organic letters |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 21 |
Pages of publication | 5192 - 5195 |
a | 14.971 ± 0.0007 Å |
b | 17.4948 ± 0.001 Å |
c | 16.7353 ± 0.0009 Å |
α | 90° |
β | 107.46 ± 0.006° |
γ | 90° |
Cell volume | 4181.3 ± 0.4 Å3 |
Cell temperature | 104 ± 2 K |
Ambient diffraction temperature | 104 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0862 |
Residual factor for significantly intense reflections | 0.0551 |
Weighted residual factors for significantly intense reflections | 0.1044 |
Weighted residual factors for all reflections included in the refinement | 0.1169 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1555342.html
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Users of the data should acknowledge the original authors of the
structural data.