Crystallography Open Database

Information card for entry 1556448

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Coordinates	1556448.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	C64 H48 F12 N6 P4 Ru
Calculated formula	C64 H48 F12 N6 P4 Ru
SMILES	[Ru]12([P](c3ccccc3)(c3ccccc3)c3ccccc3)([P](c3ccccc3)(c3ccccc3)c3ccccc3)([n]3c4ncccc4ccc3c3[n]1c(ccc3)c1[n]2c2ncccc2cc1)[N]#Cc1ccccc1.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-]
Title of publication	Facile and Selective Synthetic Approach for Ruthenium Complexes Utilizing a Molecular Sieve Effect in the Supporting Ligand
Authors of publication	Oyama, D.; Fukuda, A.; Yamanaka, T.; Takase, T.
Journal of publication	Inorganics
Year of publication	2013
Journal volume	1
Pages of publication	32 - 45
a	17.1743 ± 0.0004 Å
b	16.1763 ± 0.0004 Å
c	21.079 ± 0.0004 Å
α	90°
β	97.8336 ± 0.0007°
γ	90°
Cell volume	5801.4 ± 0.2 Å³
Cell temperature	296 ± 1 K
Ambient diffraction temperature	296 ± 1 K
Number of distinct elements	6
Space group number	9
Hermann-Mauguin space group symbol	C 1 c 1
Hall space group symbol	C -2yc
Residual factor for significantly intense reflections	0.058
Weighted residual factors for all reflections included in the refinement	0.2164
Goodness-of-fit parameter for all reflections included in the refinement	1.126
Diffraction radiation wavelength	0.71075 Å
Diffraction radiation type	MoKα
Has coordinates	Yes
Has disorder	No
Has F_obs	No

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