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Information card for entry 1556490
Preview
Coordinates | 1556490.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C26 H70 Be2 Cl2 O2 Si8 |
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Calculated formula | C26 H70 Be2 Cl2 O2 Si8 |
SMILES | [Be]1([O]2CCCC2)([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Cl][Be]([O]2CCCC2)([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Cl]1 |
Title of publication | Insights into Molecular Beryllium-Silicon Bonds |
Authors of publication | Naglav, D.; Tobey, B.; Dzialkowski, K.; Jansen, G.; Wolper, C.; Schulz, S. |
Journal of publication | Inorganics |
Year of publication | 2017 |
Journal volume | 5 |
Pages of publication | 22 |
a | 10.3667 ± 0.0007 Å |
b | 18.8628 ± 0.0012 Å |
c | 11.387 ± 0.0007 Å |
α | 90° |
β | 98.15 ± 0.004° |
γ | 90° |
Cell volume | 2204.2 ± 0.2 Å3 |
Cell temperature | 100 ± 1 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1191 |
Residual factor for significantly intense reflections | 0.0564 |
Weighted residual factors for significantly intense reflections | 0.1074 |
Weighted residual factors for all reflections included in the refinement | 0.1242 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.997 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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