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Information card for entry 1556534
Preview
Coordinates | 1556534.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | TPE-Py |
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Chemical name | TPE-EP-G |
Formula | C34.5 H29 Cl F6 N P |
Calculated formula | C34.5 H29 Cl F6 N P |
SMILES | c1ccccc1C(=C(c1ccccc1)c1ccc(/C=C/c2cc[n+](C)cc2)cc1)c1ccccc1.C(Cl)Cl.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Polymorph selectivity of an AIE luminogen under nano-confinement to visualize polymer microstructures |
Authors of publication | Khorloo, Michidmaa; Cheng, Yanhua; Zhang, Haoke; Chen, Ming; Sung, Herman H. Y.; Williams, Ian D.; Lam, Jacky W. Y.; Tang, Ben Zhong |
Journal of publication | Chemical Science |
Year of publication | 2020 |
Journal volume | 11 |
Journal issue | 4 |
Pages of publication | 997 - 1005 |
a | 11.2525 ± 0.0002 Å |
b | 9.2194 ± 0.00013 Å |
c | 59.1397 ± 0.0009 Å |
α | 90° |
β | 93.8053 ± 0.0014° |
γ | 90° |
Cell volume | 6121.7 ± 0.17 Å3 |
Cell temperature | 100.03 ± 0.11 K |
Ambient diffraction temperature | 100.03 ± 0.11 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0744 |
Residual factor for significantly intense reflections | 0.0623 |
Weighted residual factors for significantly intense reflections | 0.1501 |
Weighted residual factors for all reflections included in the refinement | 0.1577 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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