Information card for entry 1556728

Structure parameters

• Formula: C80 H104 Au4 Pt2 S8
• Calculated formula: C80 H104 Au4 Pt2 S8
• SMILES: c1(c(c(C)cc(c1)C)C[S]1[Au][S](Cc2c(cc(cc2C)C)C)[Pt]23[S]([Au][S](Cc4c(cc(cc4C)C)C)[Pt]1([S]([Au][S]2Cc1c(cc(cc1C)C)C)Cc1c(cc(cc1C)C)C)[S]([Au][S]3Cc1c(cc(C)cc1C)C)Cc1c(cc(cc1C)C)C)Cc1c(C)cc(cc1C)C)C
• Title of publication: Understanding and designing one-dimensional assemblies of ligand-protected metal nanoclusters
• Authors of publication: Hossain, Sakiat; Imai, Yukari; Motohashi, Yuichi; Chen, Zhaoheng; Suzuki, Daiki; Suzuki, Taiyo; Kataoka, Yuki; Hirata, Momoko; Ono, Tasuku; Kurashige, Wataru; Kawawaki, Tokuhisa; Yamamoto, Takahiro; Negishi, Yuichi
• Journal of publication: Materials Horizons
• Year of publication: 2020
• Journal volume: 7
• Journal issue: 3
• Pages of publication: 796 - 803
• a: 12.5672 ± 0.0018 Å
• b: 13.4332 ± 0.0019 Å
• c: 14.366 ± 0.002 Å
• α: 110.038 ± 0.001°
• β: 107.982 ± 0.001°
• γ: 103.327 ± 0.001°
• Cell volume: 2007.8 ± 0.5 ų
• Cell temperature: 100 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0263
• Residual factor for significantly intense reflections: 0.0238
• Weighted residual factors for significantly intense reflections: 0.0625
• Weighted residual factors for all reflections included in the refinement: 0.0638
• Goodness-of-fit parameter for all reflections included in the refinement: 1.062
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No