Information card for entry 1556738

Structure parameters

• Formula: C22 H30 O4 S2 Si2
• Calculated formula: C22 H30 O4 S2 Si2
• Title of publication: Crystal chemistry of layered structures formed by linear rigid silyl-capped molecules.
• Authors of publication: Lumpi, Daniel; Kautny, Paul; Stöger, Berthold; Fröhlich, Johannes
• Journal of publication: IUCrJ
• Year of publication: 2015
• Journal volume: 2
• Journal issue: Pt 5
• Pages of publication: 584 - 600
• a: 6.8197 ± 0.0003 Å
• b: 12.1073 ± 0.0005 Å
• c: 16.1123 ± 0.0007 Å
• α: 92.3607 ± 0.0019°
• β: 93.9781 ± 0.0019°
• γ: 98.3425 ± 0.0019°
• Cell volume: 1311.34 ± 0.1 ų
• Cell temperature: 150 K
• Ambient diffraction temperature: 150 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0512
• Residual factor for significantly intense reflections: 0.035
• Weighted residual factors for significantly intense reflections: 0.0436
• Weighted residual factors for all reflections included in the refinement: 0.0443
• Goodness-of-fit parameter for significantly intense reflections: 2.5
• Goodness-of-fit parameter for all reflections included in the refinement: 2.15
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No