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Information card for entry 1556892
Preview
Coordinates | 1556892.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H40 Cu2 F2 N2 O8 |
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Calculated formula | C54 H40 Cu2 F2 N2 O8 |
SMILES | [Cu]1234([O]=C(O[Cu]2([O]=C(O1)c1ccccc1)(OC(=[O]3)c1ccccc1)[O]=C(O4)c1ccccc1)c1ccccc1)[n]1ccc(cc1)[C@H]1[C@H](c2ccccc2F)[C@@H]([C@H]1c1ccccc1F)c1cc[n](cc1)[Cu]1234[O]=C(c5ccccc5)O[Cu]4([O]=C(O3)c3ccccc3)(OC(=[O]1)c1ccccc1)([O]=C(O2)c1ccccc1)[n]1ccc(cc1)[C@H]1[C@H](c2ccccc2F)[C@@H]([C@H]1c1ccccc1F)c1ccncc1 |
Title of publication | Extraordinary anisotropic thermal expansion in photosalient crystals |
Authors of publication | Yadava, Khushboo; Gallo, Gianpiero; Bette, Sebastian; Mulijanto, Caroline Evania; Karothu, Durga Prasad; Park, In-Hyeok; Medishetty, Raghavender; Naumov, Panče; Dinnebier, Robert E.; Vittal, Jagadese J. |
Journal of publication | IUCrJ |
Year of publication | 2020 |
Journal volume | 7 |
Journal issue | 1 |
Pages of publication | 83 - 89 |
a | 10.3725 ± 0.0005 Å |
b | 11.0398 ± 0.0005 Å |
c | 12.0294 ± 0.0005 Å |
α | 71.354 ± 0.001° |
β | 66.229 ± 0.001° |
γ | 65.356 ± 0.001° |
Cell volume | 1126.6 ± 0.09 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0333 |
Residual factor for significantly intense reflections | 0.0283 |
Weighted residual factors for significantly intense reflections | 0.0675 |
Weighted residual factors for all reflections included in the refinement | 0.0701 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.069 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1556892.html
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Users of the data should acknowledge the original authors of the
structural data.