Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 1556900
Preview
Coordinates | 1556900.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C62 H79 Cl2 N5 O6 Pt S |
---|---|
Calculated formula | C62 H79 Cl2 N5 O6 Pt S |
SMILES | c12ccc(cc1)c1nc(c3cccc(c4ccc(OCCOCCOCCOCCO2)cc4)n3)ccc1.CC(C)(c1cc(c2[n](nn(c3cc(cc(c3)C(C)(C)C)C(C)(C)C)c2)[Pt]([S](=O)(C)C)(Cl)Cl)cc(c1)C(C)(C)C)C |
Title of publication | Rotaxane PtII-complexes: mechanical bonding for chemically robust luminophores and stimuli responsive behaviour |
Authors of publication | Zhang, Zhihui; Tizzard, Graham J.; Williams, J. A. Gareth; Goldup, Stephen M. |
Journal of publication | Chemical Science |
Year of publication | 2020 |
Journal volume | 11 |
Journal issue | 7 |
Pages of publication | 1839 - 1847 |
a | 26.7934 ± 0.0005 Å |
b | 12.4321 ± 0.0003 Å |
c | 39.1414 ± 0.0007 Å |
α | 90° |
β | 106.494 ± 0.002° |
γ | 90° |
Cell volume | 12501.4 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 15 |
Hermann-Mauguin space group symbol | I 1 2/a 1 |
Hall space group symbol | -I 2ya |
Residual factor for all reflections | 0.0398 |
Residual factor for significantly intense reflections | 0.0371 |
Weighted residual factors for significantly intense reflections | 0.0997 |
Weighted residual factors for all reflections included in the refinement | 0.1021 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Diffraction radiation X-ray symbol | K-L~3~ |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1556900.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.